By Giulio Pozzi (Eds.)
Advances in Imaging and Electron Physics merges long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The sequence good points prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, snapshot technological know-how, electronic photo processing, electromagnetic wave propagation, electron microscopy, and the computing tools utilized in these types of domains.
- Contains contributions from prime professionals at the topic matter
- Informs and updates the entire newest advancements within the box of imaging and electron physics
- Provides practitioners drawn to microscopy, optics, photograph processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a necessary resource
- Features prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, photo technological know-how, and electronic snapshot processing
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Additional info for Particles and Waves in Electron Optics and Microscopy
2A and B, we obtain the images shown in Fig. 2C and D. By repeating the procedure starting this time from Fig. 2C and D, we obtain the images Fig. 2E and F. The overall similarity of these numerical results shows that by increasing k, the amplitude of the interval over which the phase is stationary diminishes pﬃﬃﬃ as k and justifies the assumption that the asymptotic values of the integral [Eq. (28)] is equal to the integral of the function taken on a small interval of 35 Complements of Wave Optics A B C D E F Fig.
Let the plane z ¼ 0 separating two half-spaces of different refraction indexes, n1 for z < 0 and n2 for z > 0, Fig. 6. If, in the upper half-space, we have a system of plane wavefronts described by the eikonal function [Eq. (75)] S1 ðrÞ ¼ n1 k1 Á r + a1 for z < 0 (87) and in the lower, another one described by S2 ðrÞ ¼ n2 k2 Á r + a2 for z > 0, (88) n1 z=0 n2 z Fig. 6 Refraction of a plane wave at a plane separating two media of different refraction indexes. Source: Copyright European Physical Society.
This should be compared to the cumbersome calculations involving Fresnel integrals in the real space. In fact, in the Fourier representation, if the first propagation from the plane z ¼ 0 to the plane z1 is given by Uðu, v, z1 Þ ¼ Uðu,v,0Þe 2πiz1 2 2 λ Àπiλz1 ðu + v Þ , (78) followed by the second from the plane z1 to the plane z1 + z2: 2πiz2 2 2 λ Àπiλz2 ðu + v Þ , (79) 2πiðz1 + z2 Þ Àπiλðz1 + z2 Þðu2 + v2 Þ λ (80) Uðu,v,z1 + z2 Þ ¼ Uðu,v,z1 Þe then, by combining the two, we obtain Uðu, v, z1 + z2 Þ ¼ Uðu, v, 0Þe Second, it is a trivial result that when z ¼ 0, the original wave function is recovered, a result that in the real space is more troublesome because for z !